It is widely assumed that phenotypic traits can influence rates of speciation and extinction, and several statistical approaches have been used to test for correlations between character states and ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

We propose two nonparametric tests for the null of no event-induced shifts in the location parameter of the distribution of cross-sectionally dependent stock returns and develop their distributional ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

In this module, we will introduce generalized linear models (GLMs) through the study of binomial data. In particular, we will motivate the need for GLMs; introduce the binomial regression model, ...

Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...

Keithley has introduced its third-generation on-wafer RF measurement capability for semiconductor parametric production process control. New to Keithley's third-generation RF Option is the ability to ...